| Autore/i: | C. Bonavolontà, M. Valentino, M. de Lucia, M. Ambrosio, C. Aramo, S. Macis, I. Davoli, G. Castorina, F. Monforte, B. Spataro, M. Scarselli, S. Lupi< and A. Marcelli | ||||
| Titolo: | Characterization of the transport properties of MoO3 films on copper | ||||
| Numero: | INFN - 17-13/LNF | ||||
| Data: | 28-06-2017 | ||||
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| Pubblicato su: | |||||
| PDF file: | INFN-17-13-LNF.pdf | ||||
| URL: | |||||
| Abstract: | In this study we report the first transport experiments performed on a series of thin films of MoO3 grown on a thick Cu substrate. Electrical resistance measurements have been performed for different film thickness as function of temperature down to ~20 K. Data show, due to the copper substrate, that thin films of molybdenum trioxide also at low temperature exhibits a metallic behaviour while for films with a thickness > 250 nm the semiconducting behaviour start to prevail on the metallic one. Local morphological properties and optical data are also showed to support the interpretation of the conductive behaviour of these thin layers of molybdenum oxides. |
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